Observation of Defects in ICs
X-ray observations are effective for observing the interior of resin-sealed ICs that cannot be viewed externally. This shows the observation of a defect in an integrated circuit (IC).
The CT image reveals that two of the bonding wires inside the IC are damaged.
Non-Destructive X-Ray Inspection Systems
Shimadzu offers a range of products for high-magnification inspections with a world-leading microfocus size from 0.4 µm to 1 µm.
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