Surface Analysis
Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers.
EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
Electron Probe Microanalyzer
incorporate the latest technologies to create the next generation of EPMA. New functions that offer ...
Scanning Probe Microscope
“Scanning probe microscope” (SPM) is the general term used to describe a microscope that allows the ...
XPS
The areas affecting the properties and functions of materials have become thinner and finer, as typi...













