Shimadzu Review Vol.79[1・2](2022)
Green Innovation

SPECIALLY COLLECTED PAPERS

Shimadzu Review 79[1・2] (2022)

Abstract

The scanning probe microscope (SPM) or atomic force microscope (AFM) can observe the local surface topography of a sample and measure local properties at the nanometer scale. SPM/AFM do not require an electrically conductive sample, and are extremely versatile tools that can analyze a wide range of materials from polymers to biological samples in a variety of environments including vacuum, gases, and liquids. Because of these features, SPM/AFM are expected to find use in an increasing range of applications comparable to other high-resolution observational tools such as optical microscopes and electron microscopes. We have developed the SPM-Nanoa, a new SPM/AFM with improved basic performance and enhanced usability compared to previous models. The improved features of the SPM-Nanoa enable anyone to obtain high-resolution measurements of the shape and properties of a sample with ease. The SPM-Nanoa is expected to be especially useful in the development of new materials for carbon-neutral technology. This article presents example applications of the SPM-Nanoa, including using the SPM-Nanoa to evaluate the mechanical properties of composite materials and the electrical properties of the cathode material from a lithium-ion battery.

¹X-ray /Surface Business Unit, Analytical & Measuring Instruments Division, Shimadzu Corporation, Kyoto, Japan
²Material & Infrastructure Solution Unit, Solutions Center of Excellence, Analytical & Measuring Instruments Division, Shimadzu Corporation, Kyoto, Japan
³Material & Infrastructure Solution Unit, Solutions Center of Excellence, Analytical & Measuring Instruments Division, Shimadzu Corporation, Kanagawa, Japan
⁴Shimadzu Techno-Research, Inc, Kyoto, Japan

*The information contained in Shimadzu Review has not been modified since the original publication date. Please be aware that in some cases, products mentioned within the articles are no longer available.