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Shimadzu Review 79[1・2] (2022)
Abstract
As quality control becomes increasingly advanced, there is a growing need to measure not only particle size distribution and particle number concentration, but also to detect particle shape and small quantities of contaminants, information that can be used to improve product performance and investigate the causes of product defects. However, the particle size analyzers in current widespread use are based on laser diffraction/scattering technology and not suited to measuring particle shape or detecting small quantities of contaminants. This article presents the iSpect DIA-10 dynamic particle image analysis system that uses dynamic image analysis (DIA) and can measure particle shape and detect small quantities of contaminants.
Testing Machine Business Unit, Analytical & Measuring Instruments Division, Shimadzu Corporation, Kyoto, Japan
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