inspeXio SMX-225CT FPD HR Plus - Applications

Microfocus X-Ray CT System

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Aluminum Die Castings

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MPR Image
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VR Image
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3D Measurement
 
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Defect Analysis
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Defect Analysis Histogram

Defect analysis identifies voids and displays a color-coded map of the voids based on their volume. It can also display a frequency histogram of scale the void volume and count.
 
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MPR Image　FOV = ø161.5 mm
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Defect Analysis
 

By scanning the die cast part before machining and then specifying the surface after machining (CAD data), the software can determine which voids are removed by machining, which remain internally, and which are exposed on the surface after machining.

● Voids that are removed
● Internal voids
● Voids exposed on the surface

 
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3D CAD
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Void Determination Based on Specifying Defect Cross Section and SurfaceBlue line: CAD data analysis after machining
 

GFRP(Glass Fiber Reinforced Plastic)

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Cross Sectional Image FOV = ø20 mm
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Cross Sectional Image (enlarged view)
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Cross Sectional Image (enlarged view)
 
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VR Image
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Defect Analysis
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Defect Analysis Histogram
 
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Fiber Orientation Analysis
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Fiber orientation analysis can display a color-coded map of filler orientation. Needles can also be displayed based on the orientation.
 

CFRTP (Continuous Fiber Reinforced Thermoplastic Laminate)

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MPR Image FOV = ø3.9 mm
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Oblique Image
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Defect Analysis
 
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VR Image
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Fiber Orientation Analysis

Provided by Ehime University

 

BGA (Ball Grid Array)

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MPR Image FOV = ø5 mm
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VR Image
 

Concrete

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MPR Image FOV = ø42 mm
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VR Image
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Provided by Emeritus Professor Moriyoshi at Hokkaido University
 

Lithium-Ion Rechargeable Battery

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Cross Sectional Image FOV = ø18.4 mm
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Oblique Image
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VR Image
 

Rectangular Lithium Polymer Battery (for Smartphones)

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Circuit Board

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MPR Image FOV = ø 4.4 mm
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VR Image
 

Mouse fetus

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MPR Image FOV = ø 13.7 mm
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VR Image

Analysis Using PointMaster Reverse Engineering Software

The software can align CT data with 3D-CAD data, calculate the distance between the boundary surface defined in the CT data and the corresponding 3D-CAD data, and display a color-coded map based on such differences.

For inquiries about the absorbed dose to samples such as semiconductors, please contact here.