X-Ray Photoelectron Spectrometer (XPS)

Introducing the SPM-9700 HT Plus, Shimadzu's latest high-resolution scanning probe microscope designed to meet the most demanding surface analysis needs. This advanced instrument offers unparalleled precision and efficiency, featuring high-speed scanning, enhanced stability, user-friendly interface and versatile applications.

Discover images of observations and application news across various fields utilizing scanning probe microscopy/atomic force microscopy (SPM/AFM). Additionally, you can access a list of publications that highlight our SPM/AFM data.