Observation of Wireless Earphones Using a Microfocus X-ray Inspection System

User Benefits

- By taking X-ray fluoroscopic images of wireless earphones, various electronic components inside the product can be observed non-destructively and in a short amount of time. - Even when electronic components overlap due to multilayered structures, making it difficult to observe defects through X-ray fluoroscopy, it is possible to observe any cross-section by using X-ray CT.

Introduction

In recent years, a wide variety of earphones have been sold in the United States, Japan, and China, and the earphone market has experienced remarkable growth. While wired earphones used to be mainstream, the demand for wireless earphones has been increasing due to their convenience, such as cordless use. On the other hand, as the shipment of wireless earphones increases, the number of fire accidents caused by lithium-ion batteries built into the earphones has been increasing year by year. Against this background, quality evaluation is essential in the manufacturing process of wireless earphones, and microfocus X-ray inspection systems are widely used as a means of evaluating the quality. This paper introduces a case study where the internal structure of wireless earphones was observed using X-ray fluoroscopy and X-ray CT with the microfocus X-ray inspection system Xslicer SMX-1020.

25 de mayo de 2023 GMT