Measurement of Elemental Distribution of Multi-Layer Ceramic Capacitor

User Benefits

- It is possible to confirm the state of dispersion of trace amounts of dopant elements in the dielectric layer. - It is possible to investigate the distribution of trace rare earth elements doped in the core-shell structure. - The state of diffusion of component elements in the glass frit at the dielectric layer/external electrode interface can be confirmed.

Introduction

Multi-Layer Ceramic Capacitors (MLCC) are used in electronic devices in all industries, including mobile phones and automobiles, among others. In particular, demand for MLCC is expanding accompanying the electrification of automobiles and popularization of automated driving. In response to these trends, research on miniaturization of MLCC and high-capacity electrostatic capacitance is underway in order to meet demands for further miniaturization, weight reduction, and long life in electronic devices. Because capacitance is proportional to the dielectric constant of the dielectric substance and the total number of dielectrics, and is inversely proportional to the thickness of the dielectric layers, it is necessary to select dielectric materials with a high dielectric constant, reduce the thickness of the dielectric layers, and adopt a multi-layer structure. Evaluation of the fine multi-layer structure and the distribution of trace dopant elements is important for achieving these aims. This Application News article introduces an example of an analysis of trace dopant elements of MLCC using an EPMA electron probe microanalyzer (EPMA-8050G).

October 1, 2024 GMT