SPM-9700HT High-Throughput Scanner
High-Resolution Scanning Probe Microscopes Comparison
High-Resolution Scanning Probe Microscopes Comparison
This page provides a quick overview of 3 models of high-resolution Scanning Probe Microscopes . Choose the model that best suits your analysis needs from our multi-function model SPM-9700HT, automatic observation model SPM-Nanoa, to research-grade high resolution model SPM-8100FM.
Contents
1. Summary of Product Features
High-Throughput Scanner Shortens Observation Times
• Acquisition of the image data is available at a speed of conventional than 5 times or more.
Ease of Operation Minimizes Distraction from Observation to Analysis
• Navigation function and other features ensure observations can be performed quickly and smoothly.
Functionality and Expandability to Meet a Wide Range of Requirements
• A generous selection of measurement modes and excellent expandability helps ensure reliable measurements.
Automatic Observation
• Adjusts laser beam, parameter settings during observation, and performs image processing automatically.
Extensive Functionality
• Capture sharp images with optical microscopy to SPM microscopy modes
Various Support Functionality Achieves Fast Observation
• High-throughput observation and fast physical property mapping
High Resolution
• Noise in air and liquids is reduced to 1/20 that of existing methods.
• Achieves the performance level of a vacuum-type SPM, even in air and liquids.
Improved Usability
• HT scanner extends observation area and shortens observation times.
• Dual monitors and signal indication function provide greater flexibility
2. Comparison Table
| Model | SPM-9700HT | SPM-Nanoa | SPM-8100FM | |
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atomic force microscope |
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automatic observation |
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| Max. sample size |
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| Noise level |
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| Optical axis adjustment （laser/detector） |
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| Sample setting |
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| Observation parameter setting |
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| Observation modes |
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Elastic modulus/Adhesion |
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| SPM-9700HT | SPM-Nanoa | SPM-8100FM | ||
*The functionality of SPM-9700HT is available on a made to order basis.
News / Events
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Explore the newly established SPM/AFM Solutions Plaza (formerly known as the SPM data room).
Discover images of observations and application news across various fields utilizing scanning probe microscopy/atomic force microscopy (SPM/AFM). Additionally, you can access a list of publications that highlight our SPM/AFM data.
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Cellulose nanofibers
Given that cellulose nanofibers（CNFs）offer attractive physical characteristics, such as light weight, strength, and hardness, they not only enable materials with advanced functionality, but are expected to be used as a reinforcing material that can reduce the weight of composite materials.
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Jewelry, Gemstone
Various instruments are used for the appraisal of precious stones. These instruments are not limited to general gemstone appraisal tools such as the stereoscopic microscope, but also include various analytical instruments.
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Shimadzu has released the EDX-7200 Energy Dispersive X-ray Fluorescence Spectrometer
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Shimadzu Introduces SPM-Nanoa Scanning Probe Microscope
Provides High-Level Operability and High-Speed Processing, with Automated Optical Adjustments and Observation Conditions Settings