SPM-9700HT - Specs
Scanning Probe Microscope
SPM-9700HT
| Observation modes |
Standard: Contact, Dynamic, Phase, Lateral Force (LFM), Force Modulation Optional: Magnetic Force (MFM), Current, Surface Potential (KFM) |
|---|---|
| Resolution |
X, Y: 0.2 nm, Z: 0.01 nm |
| AFM head |
Displacement detection system: Light source, optical lever, detector Light source: Laser diode (ON/OFF) Irradiates cantilever continuously, even while replacing samples. Detector: Photodetector |