SPM-Nanoa - Configuration
Scanning Probe Microscope/Atomic Force Microscope
Wide Assortment of Expansion Functionality
Functionality and Expandability for Satisfying a Wide Variety of Requirements
■ Indicates standard specifications □ Indicates optional specifications
Other specifications are also available by special order. For more information, contact a Shimadzu representative.
■Contact Mode
■Dynamic Mode
■Phase Mode
■Lateral Force Mode (LFM)
■Force Modulation Mode
□Current / I-V Mode
□Surface Potential Mode (KPFM)
□Lateral Force Mode (MFM)
■Force Curve
□Nano 3D Mapping Fast
□Piezoelectric Force
Mode (PFM)
□STM
□Vector Scanning
□Observation in Liquid
Optional
■ Indicates standard specifications □ Indicates optional specifications
Other specifications are also available by special order. For more information, contact a Shimadzu representative.
■HT Scanner
(10 μm x 10 μm x 1 μm)
□Medium-Range Scanner
(30 μm x 30 μm x 5 μm)
□Large-Range Scanner
(125 μm x 125 μm x 7 μm)
□Deep-Type Scanner
(55 μm x 55 μm x 13 μm)
□Small-Range Scanner
(2.5μm x 2.5μm x 0.5μm)
□Fiber Light
□Cross-Sectional View
Sample Holder
□Particle Analysis Software
□Active Vibration Damper
□Active Vibration Damper with a Stand
□Cantilever Mounting Jig
□Static Eliminator
□Computer Table
Shape
Contact Mode
Surface shape is observed by scanning with the amount of cantilever bending kept constant.
Dynamic Mode
Surface shape is observed by scanning with the amplitude of cantilever oscillation kept constant.
Physical Properties
Phase Mode
This mode observes the surface viscoelasticity distribution by detecting the phase shift delay in cantilever oscillation.
Lateral Force Mode (LFM)
This mode observes the horizontal forces (friction forces) by detecting cantilever torsion.
Force Modulation Mode
This mode observes the distribution of viscosity and elasticity by separating the cantilever response into amplitude and phase components.
Nano 3D Mapping™ Fast Optional
This calculates the elastic modulus, adsorption forces, or other properties of sample surfaces based on force curve measurements and then observe the distribution of those values.
Electromagnetivity (Optional)
Current Mode
Electrical properties of surfaces are observed by detecting the current flowing through the cantilever.
Surface Potential Mode (KPFM)
Surface electric potential is observed by detecting the static electric force acting on the cantilever.
Magnetic Force Mode (MFM)
Surface magnetic domain distribution is observed by detecting the magnetic force acting on the cantilever.
Piezoelectric Force Mode (PFM)
Surface polarity distribution is observed by detecting the piezoelectric response to electrical signals.
STM
Surface shape is observed by scanning the metal probe with the tunneling current kept constant.
Machining (Optional)
Vector Scanning
In this mode, surfaces can be scanned based on user-specified scan settings, such as direction, speed, load, and applied voltage.
Atmospheric Control (Optional)
Observation in Liquid
Contact, dynamic, and phase modes can be used in a liquid atmosphere.
