Surface Analysis

Surface analysis is a technique used to analyze only the thin surface layer of a solid.

As a leading manufacturer of surface analysis instruments, we confidently provide innovative instruments and solutions to meet your surface measurement and analysis needs.​

The Shimadzu surface analysis instrument portfolio includes high-resolution scanning probe microscopes (SPM)/atomic force microscopes (AFM), electron probe micro-analyzers (EPMA), and X-ray photoelectron spectrometers (XPS)/electron spectroscopy for chemical analysis (ESCA). These instruments are utilized in a wide range of applications such as steel, non-ferrous metals, environmental, food, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. Among this portfolio, we provide the SPM-Nanoa microscope, featuring powerful tools for observing the shape of micro areas and measuring their physical properties; the EPMA-8050G, which boasts unprecedented spatial resolution under all beam current conditions from SEM observation conditions to 1 μA order; and the AXIS Supra⁺ X-ray photoelectron spectrometer, which combines state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available. 

Learn more about our full lineup below.​