The AXIS Nova is designed for the very best performance at large analysis area with efficient collection of photoelectrons contributing to high sensitivity in both spectroscopy and XPS imaging modes.
Kratos AXIS Nova
Imaging X-Ray Photoelectron Spectrometer
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
State-of-the-art performance
Designed for ease of use, the AXIS Nova has automated sample loading, orthogonal cameras for easy sample positioning and intuitive data acquisition software. A unique design of the AXIS Nova is the 110mm diameter sample platen allowing unrivalled large sample handling and high sample throughput. None of these attributes compromise the market-leading performance. The AXIS Nova is capable of high sensitivity, excellent energy resolution and fast, high spatial resolution imaging. It is ready to meet the analysis needs of the most challenging applications.
Features
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The very best resolution in spectroscopic and imaging mode is another fundamentally important property of any spectrometer. Excellent spectroscopic energy resolution of the AXIS Nova allows accurate and reproducible measurement of small chemical shifts used to determine surface chemistry. -
The AXIS Nova uses ESCApe which is the common acquisition, processing and reporting software across all Kratos photoelectron spectrometers. -
The distribution of elements or chemistry across the surface is measured by XPS imaging. -
Automation of the AXIS Nova ensures ease of use of the spectrometer. -
Whilst the AXIS Nova is primarily designed for high throughput, high performance XPS, additional analytical capabilities can be added without compromising the performance. An ultraviolet He-discharge lamp can be added to allow collection of ultraviolet photoemission spectra (UPS) for valence band and work function measurements.
News / Events
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Explore the newly established SPM/AFM Solutions Plaza (formerly known as the SPM data room).
Discover images of observations and application news across various fields utilizing scanning probe microscopy/atomic force microscopy (SPM/AFM). Additionally, you can access a list of publications that highlight our SPM/AFM data.
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Cellulose nanofibers
Given that cellulose nanofibers（CNFs）offer attractive physical characteristics, such as light weight, strength, and hardness, they not only enable materials with advanced functionality, but are expected to be used as a reinforcing material that can reduce the weight of composite materials.
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Jewelry, Gemstone
Various instruments are used for the appraisal of precious stones. These instruments are not limited to general gemstone appraisal tools such as the stereoscopic microscope, but also include various analytical instruments.
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Shimadzu has released the EDX-7200 Energy Dispersive X-ray Fluorescence Spectrometer
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Shimadzu Introduces SPM-Nanoa Scanning Probe Microscope
Provides High-Level Operability and High-Speed Processing, with Automated Optical Adjustments and Observation Conditions Settings