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SPM-9700HT Plus (Main Unit)

On January 14, Shimadzu Corporation will release the SPM-9700HT Plus scanning probe microscope in Japan and overseas. This model can obtain localized physical property information in one tenth the time of previous Shimadzu models. It will contribute to evaluations and research into nano materials, as a general-purpose model of scanning probe microscope (SPM) providing both operability and efficiency.

In a scanning probe microscope, a probe with a tip on the order of 10 nm in size is brought close to a sample. A scan is performed while detecting the strength of the mechanical and electromagnetic interactions between the sample and the probe, thereby obtaining information on the three dimensional shape of the sample surface and its physical characteristics. Such devices are also referred to as atomic force microscopes (AFM). With an electron microscope, which uses an electron beam, observations must be performed in a vacuum, but an SPM can make observations and take measurements in air or in a liquid. They are used as an essential tool for research into nano-technologies and nano-science, in applications involving shape observations and evaluation of the physical properties of high polymer materials, battery materials, and biological samples.

With improved signal processing speeds and optimized control methods, this product obtains images of physical properties at higher speeds. Mapping images of the results of observations of physical properties, which took about 6 hours with previous models, can be obtained in 30 minutes or less using the dedicated Nano 3D Mapping Fast software (optionally available). Additionally, the software is equipped with NanoAssist, a function that supports stable imaging by automatically setting the observation conditions. It is also equipped with mechanisms to heighten operability, including a head-slide mechanism to quickly exchange samples, and CantileverMaster (optionally available), which simplifies attachment of the consumable probe.

Through this product, Shimadzu is supporting a revolution in nano-technology and nano-science. By shortening measurement times and improving work efficiency, Shimadzu is contributing to the advancement of research in the key areas of health care and the GX field.

Features

1. Measurements in One Tenth the Time

Nano 3D Mapping Fast (optionally available), dedicated software that measures the local modulus of elasticity, adsorption capacity, and other physical properties and then displays their distribution as an image, provides high-speed observations ten times faster than with previous Shimadzu models. The control system and drive unit have been improved, reducing work times to one tenth while retaining performance as is, thereby contributing to more efficient research and development.

2. Automatically Set Observation Parameter Settings

The software is equipped with NanoAssist, a function that automatically sets the observation conditions (parameters). Simply specify the observation range, and the software sets the conditions. Even users unfamiliar with the operations can obtain stable images.

3. Carrying on the Usability of our Best Selling Model, the SPM-9700HT

This model is equipped with popular features from our previous model, the SPM-9700HT, CantileverMaster, which enables the easy and reliable exchange of consumables, and the head-slide mechanism, which once set makes re-adjustments after each sample exchange unnecessary. Accordingly, this model carries on the usability of our previous models.

SPM-9700HT Plus (with Control Unit and PC)

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SPM-9700HT Plus