March 7, 2025 | News & Notices
Launch of Two Models of Scanning Electron Microscope “SUPERSCAN SS-4000”
The First of the Joint Brand with TESCAN “Shimadzu by TESCAN”
Product Photo: Scanning Electron Microscope “SUPERSCAN SS-4000”
- * The photo includes options.
Shimadzu Corporation launched two models of the scanning electron microscope “SUPERSCAN SS-4000” within Japan. After concluding a business partnership with the TESCAN GROUP, a.s., of the Czech Republic (Czechia), a leading manufacturer of scanning electron microscopes (hereafter, “SEM”), this is the first launch of the joint brand “Shimadzu by TESCAN.” This series is optimized for low-acceleration and low-vacuum observation, which is effective for reducing sample pretreatment. It is an instrument that solves issues regarding operation for SEM users, such as wide-area observation without distortion, automatic beam adjustment in real time, etc. Shimadzu provides software and manuals in Japanese, and provides total support from installation, inspection, repairs, and other after-sales services.
SEMs enable observation of surfaces at the nano-scale, and are essential instruments for research in science and technology. Due to the principle of irradiating a sample with an electron beam and detecting secondary electrons and backscattered electrons generated from the sample to observe differences in surface morphology and composition, it is difficult to observe samples that are easily charged (non-conductive samples). However, the SUPERSCAN SS-4000 enables observation at low accelerations that reduces charging, enabling acquisition of images with optimum resolution and contrast for non-conductive samples such as ceramics and plastics. Also, deviations in image brightness, focus, and observation center position caused by changes in beam characteristics due to changes in voltage and current during sample observation are automatically adjusted, contributing to improved work efficiency. This series is scalable to support about 20 types of analysis options, such as element analysis, electron backscatter diffraction, compound analysis, and speciation analysis, and achieves high operability with the dedicated software “Essense.'' Shimadzu Corporation will provide high value-added solutions for various research and development through the joint brand “Shimadzu by TESCAN” with TESCAN.
Features
1. Ultra-High Resolution Observation using BrightBeam Technology
By using an optical system with proprietary BrightBeam technology that provides high beam convergence under low acceleration conditions, it is possible to observe minute details of non-conductive materials and materials that are sensitive to the beam, without sample pretreatment. Also, the analysis workflow can be reduced by In Flight Beam Tracing, which automatically adjusts deviations in image brightness and focus due to changes in voltage and current, by control of the optical system with software.
2. Clear Images with Low Vacuum
Low vacuum conditions are required for observation of non-conductive samples to prevent charging phenomena caused by electrostatic charge. This product can support low vacuum in the range 7 to 500 Pa. Normal SEMs use nitrogen gas in a low vacuum. However, this product has a unique detection system using a water vapor atmosphere and a high signal amplification, so it is effective for high-sensitivity observation of biological samples in low vacuum.
3. Plentiful Analysis Options and High Operability
About 20 types of analysis options are supported, such as element analysis, electron backscatter diffraction, compound analysis, and speciation analysis. Also, high usability is realized by the integrated system with the dedicated software “ESSENCE” for element analysis, etc.
- * BrightBeam, In Flight Beam Tracing, and ESSENCE are registered trademarks of the TESCAN GROUP, a.s.
- * Parts of feature 2 and 3 are functionalities only for the large sample model.