Analysis of Minute Objects Using a Sample Compartment Type Infrared Microscopy System

User Benefits

- The infrared microscope SurveyIR can be installed in the IRSpirit-X sample compartment to analyze minute objects in a compact space. - It can easily measure minute objects of about 100 μm and store images of the measuring points. - Because the standard detector of the FTIR instrument is used, measurement is possible even in environments where liquid nitrogen cannot be used.

Introduction

The IRSpirit-X Series features the highest signal to noise ratio and maximum resolution in its class. The highly compact FTIR has a footprint smaller than an A3 sheet of paper, with dimensions of just 390 (W) × 250 (D) × 210 (H) mm. The sample compartment of the IRSpirit-X series is easily accessible whether installed in “landscape” or “portrait” orientation, so even a narrow space on a lab bench can accommodate it. It also has a compact main body and a large sample compartment that is designed to accommodate transmission accessories, such as a KBr pellet holder and demountable cells and existing Shimadzu and third-party accessories, such as single reflectance ATR attachments and diffuse reflectance attachments. The IRSpirit-X series includes TX and ZX models equipped with a DLATGS and LX models equipped with a LiTaO₃ as infrared detectors. The DLATGS detector is a high-performance model featuring a temperature control function that minimizes the influence of ambient temperature changes on measurement results. This article introduces examples of analyses of minute objects using the sample compartment type infrared microscopy system SurveyIR and the IRSpirit-TX, the most sensitive of the IRSpirit series.

December 6, 2023 GMT