Absolute Specular Reflectance Measurement
Absolute Specular Reflectance Attachment
With absolute specular reflectance measurement, as shown in the figure, a reference sample is not used, the sample-free state (air) is set at 100%, and the reflection of the sample is simply applied to the 100% setting when measuring the sample.
News / Events
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Analytical Solutions for Microplastics
Shimadzu provides analytical and measuring instruments for the study of a variety of plastic materials: for R&D, characteristic evaluation of raw materials, quality control for plastic products, and deterioration analysis. With these diverse techniques, Shimadzu provides optimal solutions for microplastics research.
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Shimadzu has released the IRSpirit-X Series
IRSpirit FTIR spectrophotometers are extremely compact, but can still be used with standard accessories from Shimadzu and other manufacturers. IRSpirit instruments come with IR Pilot software, which offers 23 application programs without the need for parameter setup. Measure multiple samples with just a few clicks.
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Shimadzu has released the MAP-100
The MAP-100 automates the typical steps needed to isolate microplastics. This improves the reproducibility of the analytical workflow, enables lab technicians to focus on other tasks, and makes handling of reagents safer.
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Latest issue of Shimadzu Journal, featuring Forensics / Toxicology, has come out.
This issue focuses on "Forensics / Toxicology", an area where science and technology are particularly important and needed. It starts with two customer interviews.
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Cellulose nanofibers
Given that cellulose nanofibers(CNFs)offer attractive physical characteristics, such as light weight, strength, and hardness, they not only enable materials with advanced functionality, but are expected to be used as a reinforcing material that can reduce the weight of composite materials.
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Shimadzu has released Infrared Microscope AIMsight
Shimadzu has released Infrared Microscope AIMsight an automatic analysis system that can be used with confidence from your first analysis, equipped as standard with enhanced functionality to support analyses.