Maintains the 52.5° X-ray take-off angle that is fundamental to analytical performance.
EPMA-1720
Electron Probe Microanalyzer
Revolutionary Fusion of Advanced Analytical Capabilities and Superb Operability Technology at the Pinnacle of Evolution Finally Arrives High Sensitivity, High Accuracy, High Resolution, and Easy-to-Understand Operation
Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
Features
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The optical microscope image appears on the same monitor as the SEM image. The sensitivity is extremely high...
| Description | Q'ty |
|---|---|
| EPMA-1720HT 5ch (CeB6, TMP) | 1 |
| EPMA-1720HT PC ASSY | 1 |
| PHASE ANALYSIS SOFTWAR | 1 |
| AIR COMPRESSOR,PC3-5.5TGL | 1 |
| THERMO-CON,HEC002-A5B S | 1 |
News / Events
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Scanning Probe Microscope SPM-9700HT Plus has been released
Introducing the SPM-9700 HT Plus, Shimadzu's latest high-resolution scanning probe microscope designed to meet the most demanding surface analysis needs. This advanced instrument offers unparalleled precision and efficiency, featuring high-speed scanning, enhanced stability, user-friendly interface and versatile applications.
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Explore the newly established SPM/AFM Solutions Plaza (formerly known as the SPM data room).
Discover images of observations and application news across various fields utilizing scanning probe microscopy/atomic force microscopy (SPM/AFM). Additionally, you can access a list of publications that highlight our SPM/AFM data.
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Cellulose nanofibers
Given that cellulose nanofibers（CNFs）offer attractive physical characteristics, such as light weight, strength, and hardness, they not only enable materials with advanced functionality, but are expected to be used as a reinforcing material that can reduce the weight of composite materials.
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Jewelry, Gemstone
Various instruments are used for the appraisal of precious stones. These instruments are not limited to general gemstone appraisal tools such as the stereoscopic microscope, but also include various analytical instruments.
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Shimadzu has released the EDX-7200 Energy Dispersive X-ray Fluorescence Spectrometer
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Shimadzu Introduces SPM-Nanoa Scanning Probe Microscope
Provides High-Level Operability and High-Speed Processing, with Automated Optical Adjustments and Observation Conditions Settings