EPMA-8050G

Electron Probe Microanalyzer

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EPMA-8050G

Debut of the Grand EPMA With a Cutting-Edge FE Electron Optical System, the Ultimate in Advanced Shimadzu EPMA Analysis Performance

This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.

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Videos

  • Multifaceted Evaluation of High-Tensile Strength Joints b/w Dissimilar GA Steel & Al Sheet Materials

    This video shows examples and effectiveness of multifaceted evaluation of joint of dissimilar materials with ultrasonic optical defect detector, X-ray CT system, electron probe microanalyzer (EPMA), and precision universal testing machine.

  • EPMA System for Evaluation of the Distribution of Constituent Components in Detailed Areas in Joints

    • Electron Probe Microanalyzer (EPMA)

    This video shows the utility of using an EPMA system to evaluate the distribution of constituent components in detailed areas of joints with dissimilar materials.

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