EDX-7200

■Electrical/electronic materials

• RoHS and halogen screening
• Thin-film analysis for semiconductors, discs, liquid crystals, and solar cells

■Automobiles and machinery

• ELV hazardous element screening
• Composition analysis, plating thickness measurement, and chemical conversion coating film weight measurement for machine parts

■Ferrous/non-ferrous metals

• Main component analysis and impurity analysis of raw materials, alloys, solder, and precious metals
• Composition analysis of slag

■Mining

• Grade analysis for mineral processing

■Ceramics

• Analysis of ceramics, cement, glass, bricks, and clay

■Oil and petrochemicals

• Analysis of sulfur in oil
• Analysis of additive elements and mixed elements in lubricating oil

■Chemicals

• Analysis of products and organic/inorganic raw materials
• Analysis of catalysts, pigments, paints, rubber, and plastics

■Environment

• Analysis of soil, effluent, combustion ash, filters, and fine particulate matter

■Pharmaceuticals

• Analysis of residual catalyst during synthesis
• Analysis of impurities and foreign matter in active pharmaceutical ingredients

■Agriculture and foods

• Analysis of soil, fertilizer, and plants
• Analysis of raw ingredients, control of added elements, and analysis of foreign matter in foods

■Other

• Composition analysis of archeological samples and precious stones, analysis of toxic heavy metals in toys and everyday goods