March 28, 2025 | News & Notices
A New Instrument for Quantum Infrared Spectroscopic Analysis of Samples with Rough Surface Topographies
Results of Joint Research with Kyoto University Published in the Internationally Recognized Journal Physical Review Applied
A research group at the Graduate School of Engineering at Kyoto University and Shimadzu Corporation have successfully pressed rough-surfaced samples against a prism surface to allow their analysis by total reflectance* quantum infrared spectroscopy. This technique can be used to analyze a variety of samples simply and easily, including samples with rough surface topographies that have posed difficulties in the past. This is expected to lead to the development of compact quantum infrared spectrometric devices for a wide range of applications such as outdoor environmental monitoring and security applications. The results of this research were published online on January 28, 2025, in the internationally recognized US journal Physical Review Applied.
Artist’s Rendition of Total Reflectance Quantum Infrared Spectroscopy
Information about the Published Paper
| Title | ： | Quantum infrared attenuated total reflection spectroscopy (Attenuated total reflectance quantum Fourier-transform infrared spectroscopy) |
| Authors | ： | Torataro Kurita (Kyoto University), Yu Mukai (Kyoto University), Ryo Okamoto (Kyoto University), Masaya Arahata (Kyoto University), Toshiyuki Tashima (Kyoto University), Hiroshi Ota (Shimadzu Corporation), Katsuhiko Tokuda (Shimadzu Corporation), and Shigeki Takeuchi (Kyoto University) |
| Journal | ： | Physical Review Applied |
- * Also called attenuated total reflection (ATR), this sampling technique places samples in contact with a high-refractive-index prism to use the light reflected from the sample-prism boundary to evaluate the optical properties of the sample. Infrared light penetrates the sample by several micrometers or less before being reflected, then is used to analyze the optical properties of microscopic regions near the reflective boundary between the prism and sample. If easily deformed samples or samples with rough surface topographies can be placed in contact with the prism, this sampling technique can reduce wavefront distortion and light scattering during analysis.
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