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Measurements with a Dimensional X-ray CT System
Shimadzu Review 78[1・2] (2021)
Abstract
As the shapes of industrial products become increasingly complex, there is growing interest in using industrial X-ray CT systems to measure three-dimensional coordinates. In contrast with typical contact type coordinate measuring machines (CMMs) that take measurements by touching the workpiece, these dimensional X-ray CT systems can obtain a point cloud of many measurement points in a single measurement and use the penetrating properties of X-rays to measure internal dimensions. We have attempted to improve registration accuracy when a dimensional X-ray CT system is used to measure dimensions. To verify a product, the deviation between CAD design values and CT imaging data must be measured accurately, and accurate measurement of this deviation requires the best possible alignment between design values and CT data. In this article, we show that effective alignment can be achieved by using a dimensional X-ray CT system together with a contact type coordinate measuring system and highly dimensionally accurate spheres. A method for relating the position of the spheres to the measured workpiece and a measurement procedure are also proposed.
1Non-Destructive Inspection Business Unit, Analytical & Measuring Instruments Division, Shimadzu Corporation, Kyoto, Japan
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