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ALTRACE - Applications

NEW

Energy Dispersive X-ray Fluorescence Spectrometer

Food Products Field

Cacao powder, rice, powdered milk, etc         Calibration Curve Method 

Cadmium, arsenic, lead, and mercury are highly regulated in food products due to their inherent toxicity. A maximum allowable value of less than 1 ppm is specified. ALTRACE can detect these levels, and as low as 0.1 mg/kg, in food products. 

Analysis Results for Standard Sample NMIJ7502-a

Analysis Results for Standard Sample NMIJ7502-a

Calibration Curve Method

  • In the calibration curve method, standard samples are measured, and
    the relationship between standard concentration and X-ray intensity is
    manifested in a curve. The curve can be used to quantify samples of
    unknown concentration.
    Standard samples should be composed of a similar matrix as the
    unknown. In addition, a curve must be made for each target element.
    Calibration curve methods can provide high accuracy and quantitative
    data. Correction methods, such as absorption/excitation correction,
    overlapping correction, and other methods, are supported.
  • Calibration Curve Method

Chemical Products and Soil

Raw materials for chemical products (liquids and powders)     FP Qualitative and Quantitative Analysis 

Energy dispersive X-ray fluorescence spectrometers are used in fields related to the environment. Powdered and granular samples can be placed in a sample cell and analyzed as is, without dissolving them. Soil contains a variety of elements. After performing a qualitative analysis of such elements, a quantitative analysis is performed using the FP method.

Analysis Results for Soil Samples

Analysis Results for Soil Samples

 

 

FP Method

The FP method determines the elemental composition using a theoretical intensity calculation. Useful for quantitative methods where it is difficult to procure standards. For samples where the main components are C, H, and O, a balance (residue) setting is required, which can be determined by the user beforehand or theoretically using the shape of the scattered X-ray profile.

Background FP Method

The background FP method uses the intensity of scattered X-rays (background) to further correct for matrix effects.

Background FP Method