SPM-Nanoa

Scanning Probe Microscope/Atomic Force Microscope

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SPM-Nanoa

A scanning probe microscope (SPM) is a tool used to observe surfaces at the nanoscale level by using a physical probe. SPM can be used to observe the shape and evaluate the physical characteristics of high polymer materials, battery materials, nano materials, etc.

The SPM-Nanoa scanning probe microscope includes an advanced high-sensitivity detection system and automatic observation function. This high-sensitivity instrument offers high-resolution observations, features a low-noise detection optical system, and automates optical adjustments and the work of setting the observation conditions. Even users unfamiliar with the operating procedures can effortlessly acquire high-resolution observation data. The SPM-Nanoa microscope provides powerful assistance for everything from observing the shape of micro areas to measuring their physical properties.

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  • SPM-Nanoa Scanning Probe Microscope/Atomic Force Microsope

    • Surface Analysis

    SPM-Nanoa microscopes include an advanced high-sensitivity detection system and automatic viewing functionality as standard features. That means you can observe what you want to observe in more detail, more easily, and more quickly. Consequently, SPM-Nanoa microscopes provide powerful assistance for everything from observing the topography of micro areas to measuring their physical properties.

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