Adjusts Laser Beam, Adjusts Parameter Settings During Observation, and Performs Image Processing Automatically
SPM-Nanoa
Scanning Probe Microscope/Atomic Force Microscope
A scanning probe microscope (SPM) is a tool used to observe surfaces at the nanoscale level by using a physical probe. SPM can be used to observe the shape and evaluate the physical characteristics of high polymer materials, battery materials, nano materials, etc.
The SPM-Nanoa scanning probe microscope includes an advanced high-sensitivity detection system and automatic observation function. This high-sensitivity instrument offers high-resolution observations, features a low-noise detection optical system, and automates optical adjustments and the work of setting the observation conditions. Even users unfamiliar with the operating procedures can effortlessly acquire high-resolution observation data. The SPM-Nanoa microscope provides powerful assistance for everything from observing the shape of micro areas to measuring their physical properties.
Features
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Capture Sharp Images with Optical Microscopy to SPM Microscopy Modes -
Various Support Functionality Achieves Fast Observation -
Videos
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SPM-Nanoa Scanning Probe Microscope/Atomic Force Microsope
SPM-Nanoa microscopes include an advanced high-sensitivity detection system and automatic viewing functionality as standard features. That means you can observe what you want to observe in more detail, more easily, and more quickly. Consequently, SPM-Nanoa microscopes provide powerful assistance for everything from observing the topography of micro areas to measuring their physical properties.
Applications
| Documents | Date Creation Date |
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2024-06-04 | |
2023-10-24 | |
2023-04-12 |
News / Events
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Explore the newly established SPM/AFM Solutions Plaza (formerly known as the SPM data room).
Discover images of observations and application news across various fields utilizing scanning probe microscopy/atomic force microscopy (SPM/AFM). Additionally, you can access a list of publications that highlight our SPM/AFM data.
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Cellulose nanofibers
Given that cellulose nanofibers（CNFs）offer attractive physical characteristics, such as light weight, strength, and hardness, they not only enable materials with advanced functionality, but are expected to be used as a reinforcing material that can reduce the weight of composite materials.
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Jewelry, Gemstone
Various instruments are used for the appraisal of precious stones. These instruments are not limited to general gemstone appraisal tools such as the stereoscopic microscope, but also include various analytical instruments.
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Shimadzu has released the EDX-7200 Energy Dispersive X-ray Fluorescence Spectrometer
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Shimadzu Introduces SPM-Nanoa Scanning Probe Microscope
Provides High-Level Operability and High-Speed Processing, with Automated Optical Adjustments and Observation Conditions Settings
Awards
Sustainability initiatives
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9 Industry, innovation and infrastructure
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Eco Products Plus Certified products
