SPM-9700HT Plus
Scanning Probe Microscope/Atomic Force Microscope
Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT Plus takes high-throughput observations to the next level.
SPM-9700HT, Nano 3D Mapping, and the Analytical Intelligence logo are trademarks of Shimadzu Corporation or its affiliated companies in Japan and/or other countries.
This instrument is not available in European regions and may also be unavailable in certain other countries. Please contact your local Shimadzu representative for information on availability.
Features
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The time required for physical property mapping has been significantly reduced compared to the previous machine.
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Only the observation range needs to be set. Other observation conditions are set automatically.
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Confirm images magnified in a variety of directions easily using the mouse, and even analyze 3D cross-section profiles.
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A generous selection of measurement modes and excellent expandability helps ensure reliable measurements, regardless of the properties that a...
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Videos
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SPM-9700 Head-Slide Mechanism
Sample replacement without stopping laser irradiation, outstanding irradiation stability, and significantly shorter analysis times. *The operating procedures are the same for SPM-9700HT Plus.
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SPM-9700 Cantilever Mounting Jig
This jig ensures easy and secure mounting of the cantilever. *The operating procedures are the same for SPM-9700HT Plus.
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SPM-9700HT High-Throughput Scanner
Due to the newly developed HT scanner that achieves a high-speed response and optimizing software and the design of the control system, acquisition of the image data is now available at a speed of less than 5 times or more(our ratio). The scanner can easily be replaced so existing scanners can be used. *The operating procedures are the same for SPM-9700HT Plus.
News / Events
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Scanning Probe Microscope SPM-9700HT Plus has been released
Introducing the SPM-9700 HT Plus, Shimadzu's latest high-resolution scanning probe microscope designed to meet the most demanding surface analysis needs. This advanced instrument offers unparalleled precision and efficiency, featuring high-speed scanning, enhanced stability, user-friendly interface and versatile applications.
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Explore the newly established SPM/AFM Solutions Plaza (formerly known as the SPM data room).
Discover images of observations and application news across various fields utilizing scanning probe microscopy/atomic force microscopy (SPM/AFM). Additionally, you can access a list of publications that highlight our SPM/AFM data.
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Cellulose nanofibers
Given that cellulose nanofibers(CNFs)offer attractive physical characteristics, such as light weight, strength, and hardness, they not only enable materials with advanced functionality, but are expected to be used as a reinforcing material that can reduce the weight of composite materials.
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Jewelry, Gemstone
Various instruments are used for the appraisal of precious stones. These instruments are not limited to general gemstone appraisal tools such as the stereoscopic microscope, but also include various analytical instruments.
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Shimadzu has released the EDX-7200 Energy Dispersive X-ray Fluorescence Spectrometer
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Shimadzu Introduces SPM-Nanoa Scanning Probe Microscope
Provides High-Level Operability and High-Speed Processing, with Automated Optical Adjustments and Observation Conditions Settings