This instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
SPM-9700HT Plus - Options
Scanning Probe Microscope/Atomic Force Microscope
Nano 3D Mapping Fast
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The time required for physical property mapping has been significantly reduced compared to the previous machine (SPM-9700HT).
The shorter mapping time enables stable physical property evaluation. 
The particle analysis software extracts multiple particles from SPM-9700 image data and calculates feature values for each particle, then analyzes and displays them. This is especially useful for processing data statistically. The following wide selection of feature values and their corresponding statistical quantities can be calculated, tabulated, sorted, or graphed. Numerical data can be exported.
Analysis Example
Sample Heating Unit
The sample can be loaded into the unit and heated. The unit can even be operated in atmospheric conditions, depending on the sample.
Observation of Heated Polymer Film
The phase image (right) clearly shows the changes in sample surface physical properties as the sample is heated.
Light Irradiation Unit
This unit enables using a fiber optic light to irradiate sample surfaces. It does not include the light source or the optical fiber. It can be operated in atmospheric conditions.
Observation of Ultraviolet Light Irradiating Pentacene Thin Film on SrTiO3
The pentacene thin film was formed as a cluster of two or three 1.6 nm thick layers. When irradiated with 365 nm wavelength ultraviolet light, the cluster structure gradually started breaking apart. After 40 minutes, the thin film cluster was mostly gone. During this time, there is negligible drift and observation is possible using the same field of view. (Data provided by Dr. Yuji Matsumoto, Frontier Research Center, Tokyo Institute of Technology).
Related information
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SPM-Nanoa microscopes include an advanced high-sensitivity detection system and automatic viewing
functionality as standard features.
That means you can observe what you want to observe in more detail, more easily, and more quickly.
Consequently, SPM-Nanoa microscopes provide powerful assistance for everything from observing the
shape of micro areas to measuring their physical properties.